view article
Figure 2
X-ray diffraction [(0{\overline 1}10)] rocking-curve mappings of wafer A3. (a) FWHM mapping (values of 25 arcsec and above are indicated by a dark-red color). (b) Δ2Θ mapping (values less than −20 arcsec are indicated by a dark-blue color, values higher than 20 arcsec are indicated by a dark-red color). Visible horizontal lines seem to be artifacts related to data-smoothing procedures to create the color contour maps.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 4| August 2020| Pages 1080-1086
https://doi.org/10.1107/S1600576720008961
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS