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Figure 7
(a) Optical microscopy of a KOH–NaOH-etched grain boundary (red colored) stacked on top of a [{\bf g} = [0{\overline 1}10]] XRT reflection image from Fig. 6[link](b). A selected area of the etched grain boundary marked by the white square is shown in (b) as a high-resolution SEM image. Etch pits related to TEDs and TMDs are marked by black arrows.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 4| August 2020| Pages 1080-1086
https://doi.org/10.1107/S1600576720008961
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