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Figure 8
Microscopy images of the KOH–NaOH-etched Al sides of A3 and A4 in the region of defect clusters stacked on top of each other. Grain boundaries of A3 (colored red) and A4 (colored blue) can be observed.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 4| August 2020| Pages 1080-1086
https://doi.org/10.1107/S1600576720008961
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