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Figure 9
(a) XRT [{\bf g} = [{\overline 2}021]] measurements of wafer B4 in transmission. The dotted triangle illustrates the border between material grown axially on top of the seed and the lateral expansion area. (b) Magnified section of the XRT image to compare the DDs of the two regions.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 4| August 2020| Pages 1080-1086
https://doi.org/10.1107/S1600576720008961
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