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Figure 2
Illustration of the ptychographic XST method. The beamline illumination was focused (off-axis) in two dimensions by two crossed and wedged MLLs. The Siemens star sample was placed 371 µm downstream of the focal plane. Images were recorded on a pixel array detector 0.71 m downstream of the sample. The scan data consist of 20 × 20 shadow images, recorded as the sample was translated across the beam profile. The phase and reference image maps were refined iteratively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 4| August 2020| Pages 927-936
https://doi.org/10.1107/S1600576720006925
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