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Figure 5
The framework structure of ZSM-5 viewed along the b axis as refined using (a) NED and (b) SAED data, showing anisotropic atomic displacement parameters for Si (yellow) and O (red) atoms. Displacement ellipsoids are drawn at the 50% probability level.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 5| October 2020| Pages 1217-1224
https://doi.org/10.1107/S1600576720009590
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