X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires

Davtyan, A.; Kriegner, D.; Holý, V.; AlHassan, A.; Lewis, R.B.; McDermott, S.; Geelhaar, L.; Bahrami, D.; Anjum, T.; Ren, Z.; Richter, C.; Novikov, D.; Müller, J.; Butz, B.; Pietsch, U.

doi:10.1107/S1600576720011516

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 10
Radial integration of the combined RSMs of (a) NW1 and (b) NW2 of sample 1 and (c) NW3 of sample 2. Data are plotted versus the angle χ which specifies the tilt with respect to the substrate surface.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 53| Part 5| October 2020| Pages 1310-1320

https://doi.org/10.1107/S1600576720011516

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