X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires

Davtyan, A.; Kriegner, D.; Holý, V.; AlHassan, A.; Lewis, R.B.; McDermott, S.; Geelhaar, L.; Bahrami, D.; Anjum, T.; Ren, Z.; Richter, C.; Novikov, D.; Müller, J.; Butz, B.; Pietsch, U.

doi:10.1107/S1600576720011516

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 11
Comparison of experimentally measured intensity profiles (color lines) along the q_r direction with respect to calculation based on bent circular NWs (full and dotted black lines). Panels (a), (b) and (c) show data for NW1 and NW2 of sample 1 and NW3 of sample 2, respectively. Various tilt integration ranges indicated in the figure legend were used to obtain these curves from data shown in Fig. 10

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 53| Part 5| October 2020| Pages 1310-1320

https://doi.org/10.1107/S1600576720011516

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page