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Figure 2
(a) Sketch of the experimental setup. The focused X-ray beam illuminates part of the NW and produces a diffraction signal, as illustrated by the examples of detector images shown as insets. Typical detector images include diffraction signal of the illuminated NW and the substrate's crystal truncation rod (CTR). (b) Diffraction geometry with respect to the NW cross section at the sample azimuth ϕ = 0° in comparison with a top view SEM image.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 5| October 2020| Pages 1310-1320
https://doi.org/10.1107/S1600576720011516
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