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Figure 5
Transmission electron micrographs of NWs from sample 1 (a) and sample 2 (b). From nanowires that have their bending plane parallel to the imaging plane, the bending difference between the samples [cf. (a) and (b)] is evident. A high-resolution image of the region marked by the red rectangle in (b) is shown in (c). By further zooming in to the region marked by the blue rectangle, planar defects can be seen. In (c), the yellow lines highlight a twinned region. The inset in (c) shows an electron diffraction pattern recorded along the [[1\bar{1}0]] cubic or equivalent [[\bar{1}\bar{1}20]] hexagonal zone axis, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 5| October 2020| Pages 1310-1320
https://doi.org/10.1107/S1600576720011516
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