X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires

Davtyan, A.; Kriegner, D.; Holý, V.; AlHassan, A.; Lewis, R.B.; McDermott, S.; Geelhaar, L.; Bahrami, D.; Anjum, T.; Ren, Z.; Richter, C.; Novikov, D.; Müller, J.; Butz, B.; Pietsch, U.

doi:10.1107/S1600576720011516

Journal of Applied Crystallography Journal of Applied
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Figure 6
The reciprocal-space maps calculated for symmetrical diffraction $[{\bf h} = (111)]$ using the exact kinematical formula (2)

[panels (a) and (c)] and the stationary-phase method in equation (7)

[(b) and (d)] for various positions z₀ of the primary beam (parameters of the graphs). The filled and empty circles denote the end points of the non-rotated reciprocal-lattice vector $[{\bf h}]$ and the rotated vector $[{\bf h}_{\rm B}]$ , respectively. The intensity is displayed logarithmically. Color bar ticks are labeled with the decadic exponents of the intensity relative to the intensity maximum.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 53| Part 5| October 2020| Pages 1310-1320

https://doi.org/10.1107/S1600576720011516

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