X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires

Davtyan, A.; Kriegner, D.; Holý, V.; AlHassan, A.; Lewis, R.B.; McDermott, S.; Geelhaar, L.; Bahrami, D.; Anjum, T.; Ren, Z.; Richter, C.; Novikov, D.; Müller, J.; Butz, B.; Pietsch, U.

doi:10.1107/S1600576720011516

Journal of Applied Crystallography Journal of Applied
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Figure 7
The reciprocal-space maps calculated using equation (2)

for $[{\bf h} = (111)]$ [panels (a), (b), (d) and (f)], $[{\bf h} = (333)]$ (c) and $[{\bf h} = (115)]$ (e). In (b) the simulation was carried out for two times larger bending radius, panel (d) shows the map calculated for two times larger NW radius, and in (f) the map shows the data for two times larger FWHM of the primary beam. The intensity is displayed logarithmically. Color bar ticks are labeled with the decadic exponents of the intensity relative to the intensity maximum.

JOURNAL OF
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CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 53| Part 5| October 2020| Pages 1310-1320

https://doi.org/10.1107/S1600576720011516

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