Grazing-incidence X-ray diffraction investigation of the coincidence site lattice of the Ge/Si(001) system

Barnscheidt, Y.; Schmidt, J.; Osten, H.J.

doi:10.1107/S1600576720009255

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 2
Schematic and simplified view of the Ge/Si(001) coincidence site lattice. The Si and Ge atoms are displayed as light grey and dark grey spots, respectively. The (100), $[(\bar 110)]$ and $[({3\bar 10} )]$ planes of the CSL are displayed in black, blue and red, respectively; the corresponding spatial distances are also shown.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 53| Part 5| October 2020| Pages 1212-1216

https://doi.org/10.1107/S1600576720009255

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