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Figure 4
Symmetric 2θ/φ scans of the 20 nm Ge/Si(001) sample in grazing-incidence setup. The angle of incidence was aligned to achieve maximum intensity of the satellite peaks. The corresponding indices are given for each peak.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 5| October 2020| Pages 1212-1216
https://doi.org/10.1107/S1600576720009255
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