Journal of Applied Crystallography
Journal of Applied
Crystallography
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Figure 5
φ
scan (±92°) of the satellite S at 2
θ
= 67.6°, as displayed in Fig. 3
. A 90° periodicity is observed.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53
|
Part 5
|
October 2020
|
Pages 1212-1216
https://doi.org/10.1107/S1600576720009255
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