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Figure 6
Multiple 2θ/φ scans of a 390 nm-thick Ge film, taken at variable angles of incidence 0.08 < αi < 0.95°.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 5| October 2020| Pages 1212-1216
https://doi.org/10.1107/S1600576720009255
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