Journal of Applied Crystallography
Journal of Applied
Crystallography
IUCr
IT
WDC
search IUCr Journals
home
archive
editors
for authors
for readers
submit
subscribe
open access
journal menu
home
archive
editors
for authors
for readers
submit
subscribe
open access
disable zoom
view article
Figure 7
Thickness dependence of the ratio of the critical angles of incidence
α
i
of the satellite S and the Ge peak.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53
|
Part 5
|
October 2020
|
Pages 1212-1216
https://doi.org/10.1107/S1600576720009255
Open
access
Follow J. Appl. Cryst.
E-alerts
Twitter
Facebook
RSS