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Figure 1
(Left) A SEM image of the prepared sample cone on top of the OMNY pin. The red frame marks the imaged and reconstructed part of the sample. (Right) A three-dimensional rendering of the reconstructed electron-density volume. A level of 33% of the theoretical electron density of pure nickel was used as a threshold for the shown surface.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 6| December 2020| Pages 1444-1451
https://doi.org/10.1107/S160057672001211X
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