view article
Figure 3
(a) A tomographic slice through the reconstructed electron-density volume. (b) A 3D resolution estimation using Fourier shell correlation of volumes reconstructed from halved data sets. (c) A line profile extracted from the image in panel (a), shown in red, and the resolution estimated in (b), shown in green, marked on the region corresponding to an outside edge of the sample.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 6| December 2020| Pages 1444-1451
https://doi.org/10.1107/S160057672001211X
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS