view article
Figure 4
(a)–(c) Polar maps of diffraction data with the diffracted intensity plotted as a function of the 2θ angle (radius) and the sample rotation angle ω for samples 1, 2 and 3, respectively. (d)–(f) Corresponding 1D diffraction data obtained by integrating over ω. (g)–(i) 3D iso-surface renderings of the CXDI reconstruction for samples 1, 2 and 3, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 6| December 2020| Pages 1562-1569
https://doi.org/10.1107/S1600576720013850
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS