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Figure 2
(a) A drawing of the dual HEXITEC detector and pinhole system, mounted on an X95 optical rail. (b) A schematic diagram of the experimental setup used for the operando battery diffraction experiments.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 6| December 2020| Pages 1434-1443
https://doi.org/10.1107/S1600576720012078
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