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Figure 4
Electron diffraction experiment on a 210 nm-thick lamella of bacteriorhodopsin, using a 200 kV cryo-TEM microscope. (a) TEM micrograph of the FIB-machined lamella of the BR crystal. The electron diffraction signal was collected from a 1.4 µm area of the lamella, indicated by a red circle with a cross. The scale bar in (a) corresponds to 5 µm. (b) The 200 kV electron diffraction pattern obtained from the area indicated in (a). (c) The electron diffraction image is corrected by subtraction of a local moving-average background, calculated with the Adxv program (https://www.scripps.edu/tainer/arvai/adxv.html). The inset shows a close-up of the electron diffraction pattern. (d) Diffraction peaks were automatically picked up by the Adxv software, and the diffraction peaks in the resolution shell of 2.7–2.45 Å had an average peak height to background ratio of 2.5.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 53| Part 6| December 2020| Pages 1416-1424
https://doi.org/10.1107/S1600576720013096
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