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Figure 10
Graphs of simulation results of a SEMSANS instrument. In the top row is plotted the intensity at the position-sensitive detector as a function of height with different field strength. The field in the first magnet is given. The second row displays the intensity when a small-angle scattering sample with a radius of 1.0 µm is inserted after the second magnet.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 1| February 2021| Pages 195-202
https://doi.org/10.1107/S1600576720015496
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