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Figure 4
The distribution of the scattering intensity as a function of the incident angle ([\alpha _{\rm i}]) of the impinging neutrons and the distance from the scattering plane (scattering depth) for the PEG microgel (a) and PNIPAM brush (b) is mapped. Intensity is simulated according to equation (3)[link]. Zero marks the scattering plane; values above refer to positions inside the silicon subphase. The white dotted lines approximately separate evanescent wave (EW) and transmitted (TS) intensities.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 1| February 2021| Pages 72-79
https://doi.org/10.1107/S1600576720014739
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