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Figure 3
X-ray residual stress analysis (case ψ = 0 with respect to the global sample reference system denoted by the subscript `g' on the coordinate axes) at a curved sample surface. σϕϕ and σrr are the in-plane (hoop) and out-of-plane (radial) normal stress components, respectively, in the different local reference systems. The angled arrows mark the pathways of the primary and the diffracted beams.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 1| February 2021| Pages 32-41
https://doi.org/10.1107/S1600576720014508
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