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Figure 5
The intensity distributions obtained for the E110 samples irradiated with fluences 1.99 × 1024 nm−2 (low fluence) and 3.2 × 1024 nm−2 (high fluence) with the 0002 reflection.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 1| February 2021| Pages 280-286
https://doi.org/10.1107/S1600576720015885
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