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![[Figure 2]](oc5004fig2mag.jpg)
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Figure 2
In situ X-ray reflectivity (XRR) profiles: experimental data (black line), simulated data (red line) and corresponding SLD of electrons. |
![[Figure 2]](oc5004fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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Figure 2
In situ X-ray reflectivity (XRR) profiles: experimental data (black line), simulated data (red line) and corresponding SLD of electrons. |
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
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