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Figure 2
Overview of XBI characterization techniques for analysis of nano/microcrystals and particles of different types. EM – electron microscopy, AFM – atomic force microscopy, DLS – dynamic light scattering, SEC-HPLC – size-exclusion chromatography, high-performance liquid chromatography, AUC – analytical ultracentrifugation, native MS – native mass spectrometry, NTA – nanoparticle tracking analysis, FACS – fluorescence-activated cell sorting.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 1| February 2021| Pages 7-21
https://doi.org/10.1107/S1600576720013989
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