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Figure 1
Experimental setup and scanning geometry. (a) The energy spectrum of the white X-ray beam ranges from 5 to 25 keV. The beam was focused down to 0.5 × 0.7 µm by a pair of Kirkpatrick–Baez mirrors. The sample-to-detector distance was about 8 cm and the scattering intensity was collected at an angle of about 90°. (b) The nanowire is self-suspended across an Si micro-trench and lies on one of its 〈111〉 side facets with its growth direction along [[01\bar 1]]. The mechanically deformed nanowire is scanned by a nano-focused white X-ray beam at 12 different positions along its growth axis, marked in black and numbered from 1 to 12.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 1| February 2021| Pages 80-86
https://doi.org/10.1107/S1600576720014855
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