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Figure 8
Le Bail fitting of synchrotron XRD data of NIST SRM 660c. Insets show the fitting quality of two Bragg peaks across the full 2θ range. Red circles represent the synchrotron powder XRD data, black and blue lines represent the fitted curve and difference curve, respectively, and the green vertical ticks correspond to the Bragg positions. The Rietveld R factors (not corrected for background) are Rp 8.9%, Rwp 12.8%, Rexp 11.25% and χ2 1.30.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 2| April 2021| Pages 498-512
https://doi.org/10.1107/S1600576721000601
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