In situ X-ray diffraction investigation of electric-field-induced switching in a hybrid improper ferroelectric

Clarke, G.; Ablitt, C.; Daniels, J.; Checchia, S.; Senn, M.S.

doi:10.1107/S1600576721001096

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 2
X-ray diffraction pattern of Ca_2.15Sr_0.85Ti₂O₇. Inset: selection of superstructure peaks indexed in the A2₁am setting (213, 124 and 524) resulting from the simultaneous condensation of X₂⁺ and $[X_{3}^{-}]$ modes.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 54| Part 2| April 2021| Pages 533-540

https://doi.org/10.1107/S1600576721001096

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page