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Figure 10
(a) Measured (open circles) and CMWP-calculated (red lines) diffraction patterns of proton-irradiated Zircaloy-2 at 350°C to a dose of 2.3 dpa. The inset is the enlarged higher-angle part of the pattern. The black lines at the bottom of the plots are the difference between the measured and calculated intensities. (b), (c), (d) Enlarged CMWP evaluations of the (10.1), (10.2) and (10.3) reflections, respectively. The satellite profiles are shown in the enlarged patterns. The red dashed and blue dashed–dotted lines are the satellite profiles of the vacancy- and interstitial-type 〈a〉 loops, respectively. (The diagonal arrows are for identifying the satellites.)

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 3| June 2021| Pages 803-821
https://doi.org/10.1107/S1600576721002673
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