addenda and errata\(\def\hfill{\hskip 5em}\def\hfil{\hskip 3em}\def\eqno#1{\hfil {#1}}\)

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767

Grazing-incidence X-ray scattering of lamellar thin films. Erratum

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aCornell High Energy Synchrotron Source, Cornell University, Ithaca, NY 14853, USA
*Correspondence e-mail: dms79@cornell.edu

Edited by V. Holý, Charles University, Prague, Czech Republic and CEITEC at Masaryk University, Brno, Czech Republic (Received 14 March 2021; accepted 21 March 2021; online 25 May 2021)

Errors in the article by Smilgies [J. Appl. Cryst. (2019), 52, 247–251] are corrected.

The equations given by Smilgies (2019[Smilgies, D.-M. (2019). J. Appl. Cryst. 52, 247-251.]) contain two errors:

Equation (5) should read

[2\theta = \arctan\left [{\left({{x^2} + {z^2}} \right)/L} \right].]

Equation (11) should read

[{q_y} = {{2\pi } \over \lambda }\sin \left({{\psi}} \right)\cos({{\beta}}).]

Note also that the d spacing used for generating the images in Fig. 4 is 1.5 nm. The notations qhkl and Ghkl are used interchangeably for the scattering vector associated with Bragg reflection hkl.

Acknowledgements

I thank Justin Kwok, University of Illinois at Urbana-Champaign, and Linda Grodd, Universität Siegen, Germany, for pointing out these issues.

Funding information

The following funding is acknowledged: National Science Foundation, Directorate for Mathematical and Physical Sciences (award No. DMR-1332208).

References

First citationSmilgies, D.-M. (2019). J. Appl. Cryst. 52, 247–251.  CrossRef CAS IUCr Journals Google Scholar

This article is published by the International Union of Crystallography. Prior permission is not required to reproduce short quotations, tables and figures from this article, provided the original authors and source are cited. For more information, click here.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
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