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Figure 2
The FI confidence ellipses for k = 1, 2, 3 (red) overlaid on the corner plots of MCMC (black) and nested sampling (blue) for the mostly uncorrelated parameter sample (left) and correlated parameter sample (right). Insets are the SLD profiles (top) and rebinned simulated reflectivity curves (bottom) of the two samples.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 4| August 2021| Pages 1100-1110
https://doi.org/10.1107/S160057672100563X
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