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Figure 3
Log FI uncertainty (top), log fitting uncertainty (middle) and mean absolute error (bottom) versus log measurement time multiplier for each parameter of the mostly uncorrelated parameter sample (left) and correlated parameter sample (right). The uncertainties are taken as the mean from ten simulated experiments for a given time multiplier. Included in the legends of the uncertainty time-dependence plots are approximations of the gradients of the lines m, as given by linear regression.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 4| August 2021| Pages 1100-1110
https://doi.org/10.1107/S160057672100563X
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