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![[Figure 2]](jl5021fig2mag.jpg)
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Figure 2
High-resolution TEM image of a grain of a new phase and its fast Fourier transform pattern. The main peaks in the FT correspond to distances of 1.8, 2.6 and 3.0 Å (see also Table S1). |
![[Figure 2]](jl5021fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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Figure 2
High-resolution TEM image of a grain of a new phase and its fast Fourier transform pattern. The main peaks in the FT correspond to distances of 1.8, 2.6 and 3.0 Å (see also Table S1). |
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
