view article
Figure 5
View along the axis of the Debye–Scherrer cone (x axis), showing the axial position, za, where the diffracted beam is intercepted by the analyzer crystal.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 4| August 2021| Pages 1088-1099
https://doi.org/10.1107/S1600576721005288
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS