view article
Figure 3
(a) Schematic representation of the angles γ, δ, 2θ and χ, subtended by the incoming beam wavevector k and a generic scattering wavevector k′ and (b) diagram showing the offsets Δx and Δz from the detector center of a generic (i, j) pixel. The vector d (where |d| is the distance of the pixel from the diffractometer center) subtends the angles δp and γp.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 4| August 2021| Pages 1140-1152
https://doi.org/10.1107/S1600576721006245
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS