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Figure 9
Rietveld refinement of a NIST LaB6 SRM 660c PXRD pattern, measured with a 20 keV X-ray beam, performed with Fullprof using the pseudo-Voigt line shape. Before the refinement, the data were corrected by Lorentz and polarization factors, flat-detector corrections and interaction volume of X-rays with a capillary. The background was subtracted by fitting a Chebychev polynomial (16 coefficients).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 4| August 2021| Pages 1140-1152
https://doi.org/10.1107/S1600576721006245
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