view article

Figure 10
Absolute error (59)[link] computed for the stochastic model defined through equations (60)[link], (61)[link] and (62)[link]. For each histogram 1000 random line integral measurements have been sampled from each of 100 spherical crystal states, resulting in a total of 100 000 data points per histogram. The maximum field difference in Euler angles and strain (Ae and As) increases from bottom to top and left to right, respectively, as indicated by the figure labels. (Note that the maximum counts of the bottom-left plot have been clipped in order to facilitate equal axes between subplots while maintaining good visibility of the histograms.)

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds