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Figure 12
0 0 0 12 synchrotron X-ray back-reflection topograph of 4H-SiC with 8° offcut towards [[11 {\overline 2} 0]]. TSDs/TMDs show circular white contrast completely enclosed with dark outlines under the strong diffraction condition (white square), but the circles are no longer completely enclosed under the weak diffraction condition (black square).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 4| August 2021| Pages 1225-1233
https://doi.org/10.1107/S1600576721006592
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