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Figure 7
In situ time–temperature profiles for (top) fast- and (bottom) slow-cooling experiments. In both plots the open circles represent the points at which diffraction data were collected. In the bottom panel the dotted line represents the temperature profile of the cell based on the temperature recorded at the start of each day. The short plateaux after the second diffraction point is due to a networking failure early in the experiment such that the cell remained at constant temperature. The gaps between diffraction data points at 20, 60, 130 and 220 days are due to scheduled synchrotron shutdowns. The small rise in temperature at ∼190 days is due to ice build-up in the chiller reservoir which restricted coolant circulation until being removed.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 5| October 2021| Pages 1455-1479
https://doi.org/10.1107/S1600576721008554
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