Non-ambient X-ray and neutron diffraction of novel relaxor ferroelectric xBi2(Zn2/3,Nb1/3)O3–(1 – x)BaTiO3

Marshall, J.; Walker, D.; Thomas, P.

doi:10.1107/S160057672100858X

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 7
Orthorhombic parameters from X-ray and neutron data at 295 K. (a) X-ray data for 3.0 < x < 8.0%, (b) neutron data for 3.0 < x < 8.0% and (c) X-ray data for 1.0 < x < 20.0%, where x = 1.0% is the lower limit for diffracted intensity attributed to Amm2 at 295 K.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 54| Part 5| October 2021| Pages 1437-1454

https://doi.org/10.1107/S160057672100858X

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