An electric field cell for performing in situ single-crystal synchrotron X-ray diffraction

Saunders, L.K.; Yeung, H.H.-M.; Warren, M.R.; Smith, P.; Gurney, S.; Dodsworth, S.F.; Vitorica-Yrezabal, I.J.; Wilcox, A.; Hathaway, P.V.; Preece, G.; Roberts, P.; Barnett, S.A.; Allan, D.R.

doi:10.1107/S1600576721007469

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 10
A single-crystal sample of SQABPY-I measured in situ in the I19 ELF cell during voltage ramping and data collection on beamline I19-2, Diamond Light Source. (a) Before-voltage (0 V) yellow form, (b) during-high-voltage (2400 V) red-shifted yellow form and (c) after-voltage-off (0 V) yellow form. The reciprocal lattice of diffraction spots (as viewed down the c axis in the DIALS reciprocal lattice viewer) from the data processing spot-finding routine for (d) the before-voltage (0 V) yellow form, (e) the during-high-voltage (2400 V) red-shifted yellow form and (f) the after-voltage (0 V) yellow form.

JOURNAL OF
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CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 54| Part 5| October 2021| Pages 1349-1359

https://doi.org/10.1107/S1600576721007469

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