Data reduction for serial crystallography using a robust peak finder

Hadian-Jazi, M.; Sadri, A.; Barty, A.; Yefanov, O.; Galchenkova, M.; Oberthuer, D.; Komadina, D.; Brehm, W.; Kirkwood, H.; Mills, G.; Wijn, R. de; Letrun, R.; Kloos, M.; Vakili, M.; Gelisio, L.; Darmanin, C.; Mancuso, A.P.; Chapman, H.N.; Abbey, B.

doi:10.1107/S1600576721007317

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 15
Examples of pre-calculated global thresholds for Bragg peaks using the relation between the average (μ_B) and variance ( $[\sigma^{2}_{\rm B}]$ ) of the Poisson distribution, employed to model the background. The blue region shows the acceptable intensity values for Bragg peak pixels for T = 3.25ϕ and τ = 6. The axis values are normalized by ϕ.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 54| Part 5| October 2021| Pages 1360-1378

https://doi.org/10.1107/S1600576721007317

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page