Data reduction for serial crystallography using a robust peak finder

Hadian-Jazi, M.; Sadri, A.; Barty, A.; Yefanov, O.; Galchenkova, M.; Oberthuer, D.; Komadina, D.; Brehm, W.; Kirkwood, H.; Mills, G.; Wijn, R. de; Letrun, R.; Kloos, M.; Vakili, M.; Gelisio, L.; Darmanin, C.; Mancuso, A.P.; Chapman, H.N.; Abbey, B.

doi:10.1107/S1600576721007317

Journal of Applied Crystallography Journal of Applied
Crystallography

IUCr IT WDC

home archive editors for authors for readers submit subscribe open access

view article

Figure 8
Comparison of the (a) R_split and $[{\rm CC}^*]$ and (b) SNR and CC_1/2 values as a function of resolution (Å) for the CXIDB32 data set. Three tests were performed comparing RPF, PF8 and RPF + PF8 peak-finding algorithms.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 54| Part 5| October 2021| Pages 1360-1378

https://doi.org/10.1107/S1600576721007317

Open

access

Follow J. Appl. Cryst.

Search IUCr Journals		doi		Advanced search
Author		volume	page