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Figure 6
(a) A 45 nm thick slice of the primary particle configuration. (b) A TEM image of the same sample. (c) A magnified image of the primary particle configuration of the same size as the TEM image.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 5| October 2021| Pages 1290-1297
https://doi.org/10.1107/S1600576721006701
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