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Figure 1
Experiment for characterizing multi-domain thin films. (a) GIWAXS measurement geometry. (b) An X-ray beam is scanned in the x direction at all azimuthal rotation angles ϕ to produce tomographic data. A given crystalline domain has a well defined in-plane orientation and thus the diffraction condition is satisfied only at a set of specific rotation angles.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 5| October 2021| Pages 1327-1339
https://doi.org/10.1107/S1600576721007184
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