Grazing-incidence X-ray diffraction tomography for characterizing organic thin films

Tsai, E.H.R.; Xia, Y.; Fukuto, M.; Loo, Y.-L.; Li, R.

doi:10.1107/S1600576721007184

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 3
Overview of GID tomography. (a) GIWAXS patterns are collected while scanning in x and rotation angle ϕ and subsequently used to form (b) peak sinograms for each peak, e.g. (011), (020). (c) On the basis of the indexing of GIWAXS patterns, a series of azimuthal rotation angles are calculated, each corresponding to a peak. (d) The sinogram for domain d_n is then formed from 1D projections I^(p_m)_{d_n}, each at angle $[\phi^{(p_{m})}_{d_{n}}]$ of the corresponding peak sinogram for peak p_m. From the domain sinograms in (d), tomographic reconstruction methods can then be used to recover (e) the shape of each domain on (f) the entire thin film.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 54| Part 5| October 2021| Pages 1327-1339

https://doi.org/10.1107/S1600576721007184

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