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Figure 6
Scattering data and peak sinograms. (a) Summed GIWAXS patterns with peak ROIs for the glass-substrate sample (top row) and the silicon-substrate sample (bottom row). (b) Peak sinograms for the 020 peak and (c) their integrated 1D intensity curves. Pink highlights indicate the existence of domains.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 54| Part 5| October 2021| Pages 1327-1339
https://doi.org/10.1107/S1600576721007184
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